首页> 外国专利> MM-WAVE SHORT FLAT-FIELD SCHMIDT IMAGER USING ONE OR MORE DIFFRACTION GRATING(S) AND/OR FRESNEL LENS (S)

MM-WAVE SHORT FLAT-FIELD SCHMIDT IMAGER USING ONE OR MORE DIFFRACTION GRATING(S) AND/OR FRESNEL LENS (S)

机译:使用一个或多个衍射光栅和/或菲涅耳透镜(S)的MM波短平面施密特图像

摘要

A millimeter-wave optical imaging system including an imaging detector located at a focal plane of the optical imaging system, the imaging detector being responsive to electromagnetic radiation in wavelength range of approximately 5 - 50 millimeters, an immersion lens directly coupled to the imaging detector and configured to focus the electromagnetic radiation onto the imaging detector, wherein the focal plane is located on a planar surface of the immersion lens and the imaging detector is directly coupled to the planar surface, a positive power primary mirror configured to reflect the electromagnetic radiation towards the immersion lens, and one of a Fresnel lens or a diffraction grating configured to receive and direct the electromagnetic radiation towards the primary mirror.
机译:一种毫米波光学成像系统,包括位于光学成像系统的焦平面的成像检测器,成像检测器响应于大约5 - 50毫米的波长范围内的电磁辐射,浸没透镜直接耦合到成像检测器和被配置为将电磁辐射聚焦到成像检测器上,其中焦平面位于浸没透镜的平面表面上,并且成像检测器直接连接到平面表面,正电初级镜被配置为将电磁辐射反射到朝向的电磁辐射浸渍透镜,以及菲涅耳透镜或衍射光栅之一,其配置成接收并将电磁辐射朝向主镜子接收。

著录项

  • 公开/公告号WO2021141658A1

    专利类型

  • 公开/公告日2021-07-15

    原文格式PDF

  • 申请/专利权人 RAYTHEON COMPANY;

    申请/专利号WO2020US58878

  • 发明设计人 COOK LACY G.;

    申请日2020-11-04

  • 分类号H01Q19/06;H01Q19/09;H01Q19/17;H01Q15/08;G01V8;

  • 国家 US

  • 入库时间 2022-08-24 19:58:10

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号