首页> 外国专利> INFORMATION PROCESSING DEVICE, PARTICLE MEASUREMENT DEVICE, PARTICLE MEASUREMENT SYSTEM, PARTICLE SORTING DEVICE, PARTICLE SORTING SYSTEM, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING PROGRAM

INFORMATION PROCESSING DEVICE, PARTICLE MEASUREMENT DEVICE, PARTICLE MEASUREMENT SYSTEM, PARTICLE SORTING DEVICE, PARTICLE SORTING SYSTEM, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING PROGRAM

机译:信息处理设备,粒子测量装置,粒子测量系统,粒子分拣装置,粒子分类系统,信息处理方法和信息处理程序

摘要

The present invention provides a particle analysis technique capable of visualizing a particle population appropriately. This information processing device has an information processing unit that receives optical data acquired from particles, and calculates, on the basis of the received optical data, parameters for identifying a method for displaying the optical data within a display range which has at least one axis comprising a linear axis and a logarithmic axis. The parameters include a first parameter for identifying the range of the linear axis and a second parameter for identifying the lower limit value of the display range, and the first and second parameters are calculated on the basis of different reference values.
机译:本发明提供了一种颗粒分析技术,其能够适当地可视化颗粒群。该信息处理设备具有信息处理单元,其接收从粒子获取的光学数据,并基于所接收的光学数据来计算用于识别用于在显示范围内显示光学数据的方法的参数,该显示范围内具有至少一个轴的显示范围内的光学数据线性轴和对数轴。该参数包括用于识别线性轴的范围的第一参数和用于识别显示范围的下限值的线性轴的范围,并且基于不同的参考值计算第一和第二参数。

著录项

  • 公开/公告号WO2021131415A1

    专利类型

  • 公开/公告日2021-07-01

    原文格式PDF

  • 申请/专利权人 SONY GROUP CORPORATION;

    申请/专利号WO2020JP42950

  • 发明设计人 OTSUKA FUMITAKA;

    申请日2020-11-18

  • 分类号G01N15/14;

  • 国家 JP

  • 入库时间 2022-08-24 19:52:47

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