首页> 外国专利> DEVICE FOR IMPROVING PERFORMANCE IN STED AND RESOLFT MICROSCOPY USING A SINGLE PHASE MASK

DEVICE FOR IMPROVING PERFORMANCE IN STED AND RESOLFT MICROSCOPY USING A SINGLE PHASE MASK

机译:使用单相面罩提高STED和分辨率显微镜性能的装置

摘要

The present invention refers to a method for high spatial resolution imaging comprising a phase plate or a spatial light modulator (SLM) device for STimulated Emission Depletion (STED) microscopy and Reversible Saturable OpticaL Fluorescence Transitions (RESOLFT) microscopy, where a bivortex pattern is imprinted on the said phase plate or SLM to generate a beam. The bivortex pattern allows some freedom in shaping the STED beam to improve the microscope's axial performance and optical sectioning capacity.;The present invention further refers to a method for STED and RESOLFT microscopy comprising the step of modulating the optical phase of a laser using a phase plate or a spatial light modulator device with a phase mask comprising a bivortex with a tunable radius.;The disclosed phase masks and methods of STED and RESOLFT microscopy may advantageously be applied to provide a hybrid 2D/3D STED regime but one with a significant reduction in the degrees of freedom for alignment relative to what is found in incoherent beam superpositions, thus providing an improvement in beam quality, namely a minimized central intensity and lower sensitivity to aberrations, resulting in an increased signal level and axial performance.
机译:本发明涉及一种用于高空间分辨率成像的方法,包括相板或用于刺激发射耗尽(STED)显微镜和可逆可饱和光学荧光转变(分辨率)显微镜的空间光调制器(SLM)器件,其中Bivortex图案被压印在所述相板或SLM上产生梁。 Bivortex图案允许在整形筒束上形成一些自由度,以提高显微镜的轴向性能和光学切片能力。;本发明还指的是用于分辨和分辨率显微镜的方法,包括使用相位调制激光的光学相位的步骤具有相位掩模的板或空间光调制器装置,其包括具有可调谐半径的比蚀。;所公开的相位掩模和STED和分辨率显微镜的方法可以有利地应用于提供混合器2D / 3D STED制度,但是一个具有显着减少的混合动力在相对于在非相干光束叠加中发现的内容的对准自由度,从而提供光束质量的改善,即最小化的中心强度和对像差的较低的敏感性,导致信号电平增加和轴向性能。

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