TEST SYSTEM EXECUTING SHORT-TEST OF PLURALITY OF TEST UNITS SIMULTANEOUSLY AND TEST SYSTEM EXECUTING OPEN-TEST OF PLURALITY OF TEST UNITS SIMULTANEOUSLY

摘要

The test system includes a row decoder, a column decoder, a column unit test control unit, and a test circuit. The row decoder activates one of the first to Mth row signals based on the plurality of row input signals. The column decoder activates one of the first to Nth column signals based on the plurality of column input signals. When the column unit test enable signal is activated, the column unit test control unit outputs the activated first to Nth column output signals, and when the column unit test enable signal is deactivated, the first to Nth column signals are respectively first. To Nth column output signals. The test circuit includes first to Mth row test blocks each having first to Nth test units. The first to Mth row test blocks correspond to the first to Mth row signals, respectively. The test circuit corresponds to the activated row signal among the first to Mth row signals based on the first and second test signals and the first to Nth column output signals when the column unit test enable signal is activated. The short-circuit test of the first to Nth test units included in the row test block is simultaneously performed.