Accuracy management method, accuracy management system, management device, analysis device, and judgment method of abnormality management accuracy

摘要

PROBLEM TO BE SOLVED: To provide an accuracy management method, an accuracy management system, a management system, an analyzer, and an accuracy management abnormality determination method capable of enhancing a quality of accuracy management by fully utilizing measurement results of both of an accuracy management material and a specimen.SOLUTION: In an accuracy management method used in a management device 30 connected to an analyzer 20 installed on each of a plurality of facilities 12 via a network 13, first accuracy management information obtained by measurement of an artificially generated accuracy management material by the analyzer 20 of each facility 12 and second accuracy management information obtained by measuring a plurality of specimens are acquired from the analyzer 20 of each facility 12, respectively, via the network 13, and information about the accuracy management of the analyzer 20 of at least one facility 12 is output on the basis of the acquired first accuracy management information and second accuracy management information.SELECTED DRAWING: Figure 1