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Polarizing structured illumination microscopy for 3D surface profiling
Polarizing structured illumination microscopy for 3D surface profiling
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机译:偏振结构化照明显微镜3D表面分析
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摘要
The present invention relates to a polarization pattern irradiation microscope, and more specifically, a phase-shifted interference pattern is formed using divided polarized lights, and the focus of an objective lens is changed using a variable focus lens. It relates to a polarization pattern irradiation microscope that can quickly measure the 3D shape of a specimen without movement.
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