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Fault detection and localization using combinatorial test design techniques while adhering to architectural restrictions
Fault detection and localization using combinatorial test design techniques while adhering to architectural restrictions
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机译:使用组合测试设计技术的故障检测与定位,同时遵守建筑限制
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摘要
Systems, methods, and computer-readable media are described for performing fault detection and localization using Combinatorial Test Design (CTD) techniques and generating a regression bucket of test cases that expose a detected fault in a System Under Test (SUT). The SUT may be a hardware system or a software system. Further, the fault detection and localization may be performed while adhering to architectural restrictions on the SUT.
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