XRF analysis of layered samples

摘要

PROBLEM TO BE SOLVED: To provide a method of making X-ray fluorescence (XRF) measurements of a layered sample.SOLUTION: At least two measurements are made, one through one surface of the sample and another through the opposite surface. This may be conveniently done by inverting the sample between the measurements. The data from the additional measurements may be used to calculate multiple parameters of the sample, such as the concentration, density or thickness of each of the layers.SELECTED DRAWING: Figure 1