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Exam question generator, exam system and exam question generator

机译:考试问题发生器,考试系统和考试问题发生器

摘要

PROBLEM TO BE SOLVED: To provide an examination question generator, an examination system and an examination question generation program capable of generating a question and an answer in which an examinee can more accurately grasp the cause of an error for an examinee who has an incorrect answer to a question. .. A test system generates a plurality of questions that make up an exam based on a question pattern selected from a database that stores a plurality of question patterns. Then, the test system generates a correct answer for each generated question, and also generates an incorrect answer for each generated question based on a predefined wrong answer factor associated with the question pattern. Generate test data that includes multiple questions with. [Selection diagram] Fig. 3
机译:要解决的问题:提供一个考试问题发生器,考试系统和考试问题的项目,能够产生问题和一个答案,其中考试人员可以更准确地掌握一个错误答案的考生错误的原因一个问题。 ..测试系统生成多个问题,这些问题基于从存储多个问题模式的数据库中选择的问题模式来完成考试。然后,测试系统为每个生成的问题生成正确的答案,并且还基于与问题模式相关联的预定义的错误答案因子生成每个生成的问题的错误答案。生成包含多个问题的测试数据。 [选择图]图3

著录项

  • 公开/公告号JP2021067821A

    专利类型

  • 公开/公告日2021-04-30

    原文格式PDF

  • 申请/专利权人 株式会社 スプリックス;

    申请/专利号JP20190193175

  • 发明设计人 常石 博之;

    申请日2019-10-24

  • 分类号G09B7/04;G09B7/08;G06Q50/20;

  • 国家 JP

  • 入库时间 2022-08-24 18:30:33

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