首页> 外国专利> Progressive Photon Mapping Method Employing Statistical Model Test

Progressive Photon Mapping Method Employing Statistical Model Test

机译:采用统计模型测试的渐进光子映射方法

摘要

A progressive photon mapping method based on statistical test includes launching rays from the viewpoint to each pixel on the image plane and intersecting the three-dimensional scene to be rendered. If an intersection with diffuse surface is found on the tracing path, it is recorded as the hit point; a photon pass is performed: 31) performing photon tracing step; 32) performing photon collection processing for each hit point; 33) if the current iteration of photon pass does not need chi-square test, then performing flux accumulation and keeping the collection radius unchanged; if chi-square is required, evaluating the photon distribution quality; computing a collection radius according to the estimated photon distribution, and performing the flux accumulation in the current photon pass; 34) if the photon collection radius is reduced, then performing distributed ray tracing, generating new hit points, and go to 31), otherwise go to 31), start a new iteration of photon pass.
机译:基于统计测试的渐进光子映射方法包括从图像平面上的每个像素的观点发射光线并与要呈现的三维场景相交。如果在跟踪路径上发现与漫射表面的交叉点,则记录为命中点;执行光子通道: 31 )进行光子跟踪步骤; 32 )对每个命中点进行光子收集处理; 33 )如果光子通道的电流迭代不需要Chi-Square测试,则执行磁通蓄积并保持收集半径不变;如果需要Chi-Square,则评估光子分布质量;根据估计的光子分布计算集合半径,并在电流光子通道中执行磁通量累积; 34 )如果光子收集半径减小,则执行分布式光线跟踪,生成新的命中点,然后转到 31 ),否则转到 31 ),开始新的光子通道迭代。

著录项

  • 公开/公告号US2021118222A1

    专利类型

  • 公开/公告日2021-04-22

    原文格式PDF

  • 申请/专利权人 PEKING UNIVERSITY;

    申请/专利号US201817041650

  • 申请日2018-03-30

  • 分类号G06T15/50;G06T15/06;

  • 国家 US

  • 入库时间 2022-08-24 18:19:46

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号