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Kelvin probe system with rotating probe surface
Kelvin probe system with rotating probe surface
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机译:具有旋转探头表面的Kelvin探针系统
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摘要
The Kelvin probe system (100) for analyzing the test sample (134) is controlled and powered by a drive control / power (103) for rotating the object (106, 120) about the axis of rotation. A Kelvin probe head (120) connected to the drive (102), and a Kelvin probe (122) having a Kelvin probe surface (124) at one end, and a Kelvin probe head (120) connected to the drive (102) A surface is provided on a side surface of the Kelvin probe head with respect to the rotation axis. A calibration system for the Kelvin probe system (100) and a method for measuring the presence of hydrogen using the Kelvin probe system (100) are also provided.
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