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Kelvin probe system with rotating probe surface

机译:具有旋转探头表面的Kelvin探针系统

摘要

The Kelvin probe system (100) for analyzing the test sample (134) is controlled and powered by a drive control / power (103) for rotating the object (106, 120) about the axis of rotation. A Kelvin probe head (120) connected to the drive (102), and a Kelvin probe (122) having a Kelvin probe surface (124) at one end, and a Kelvin probe head (120) connected to the drive (102) A surface is provided on a side surface of the Kelvin probe head with respect to the rotation axis. A calibration system for the Kelvin probe system (100) and a method for measuring the presence of hydrogen using the Kelvin probe system (100) are also provided.
机译:用于分析测试样品(134)的Kelvin探针系统(100)被驱动控制/功率(103)控制和动力,用于围绕旋转轴旋转物体(106,120)。连接到驱动器(102)的Kelvin探针头(120),以及在一端具有kelvin探针表面(124)的kelvin探针(122),以及连接到驱动器(102)a的kelvin探针头(120)表面设置在Kelvin探针头的侧表面上相对于旋转轴线。还提供了适用于Kelvin探针系统(100)的校准系统和使用Kelvin探针系统(100)测量氢的存在的方法。

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