首页> 外国专利> QUANTUM CIRCUIT RISK ANALYSIS

QUANTUM CIRCUIT RISK ANALYSIS

机译:量子电路风险分析

摘要

The technology described herein is directed towards quantum circuits used to analyze risk, including expected value, variance, value at risk and conditional value at risk metrics. Aspects can comprise modeling uncertainty of one or more random variables to provide a first quantum sub-circuit by mapping the one or more variables to quantum states represented by a selected number of qubits using quantum gates, and encoding a risk metric into a second quantum sub-circuit, the second quantum sub-circuit comprising a first ancilla qubit and Y-rotations controlled by one or more other qubits. Further aspects can comprise performing amplitude estimation based on the first sub-circuit and the second sub-circuit to extract a probability value corresponding to the risk metric, wherein the probability value represents a probability of measuring a one state in the ancilla qubit.
机译:这里描述的技术涉及用于分析风险的量子电路,包括预期值,方差,风险度量的价值和风险指标的条件价值。方面可以包括建模一个或多个随机变量的不确定性,以通过使用量子门将一个或多个变量映射到由所选数量的Qubits表示的量子状态来提供第一量子子电路,并将风险度量编码为第二量子子-Circuit,第二量子子电路包括由一个或多个其他QUBITS控制的第一辅子QUBET和Y转。其他方面可以包括基于第一子电路和第二子电路执行幅度估计,以提取与风险度量相对应的概率值,其中概率值表示在ANCILLA QUBEB中测量一个状态的概率。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号