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IMPACT ANALYSIS DEVICE, IMPACT ANALYSIS METHOD, AND IMPACT ANALYSIS PROGRAM

机译:影响分析装置,影响分析方法和影响分析计划

摘要

The present invention aims to provide a technology capable of displaying the impact of differences in conditions when software is executed. This impact analysis device comprises: an execution trace accumulation unit that accumulates a plurality of execution traces collected under each of a plurality of different conditions; a representative execution trace calculation unit that calculates a representative execution trace that includes a plurality of events and the average and variation in time of each of the plurality of events, calculating same on the basis of the plurality of execution traces collected by the execution trace accumulation unit; and a representative execution trace accumulation unit that accumulates the representative execution traces calculated by the representative execution trace calculation unit.
机译:本发明的目的是提供一种能够在执行软件时显示在条件下差异影响的技术。该影响分析装置包括:执行跟踪累积单元,其累积在多个不同条件下的每个执行迹线下收集的多个执行迹线;代表性执行跟踪计算单元,其计算包括多个事件的代表性执行跟踪以及多个事件中的每一个的每个事件的平均值和变化,基于执行跟踪累积收集的多个执行迹线计算相同的相同单元;和代表性执行跟踪累积单元,其累积由代表执行跟踪计算单元计算的代表执行迹线。

著录项

  • 公开/公告号WO2021064887A1

    专利类型

  • 公开/公告日2021-04-08

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORPORATION;

    申请/专利号WO2019JP38885

  • 发明设计人 KASHIWAGI RYO;

    申请日2019-10-02

  • 分类号G06F11/32;G06F11/34;

  • 国家 JP

  • 入库时间 2022-08-24 18:09:41

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