首页> 外国专利> METHOD FOR MANUFACTURING CURVED-SURFACE DETECTOR, AND CURVED-SURFACE DETECTOR MANUFACTURED USING THE MANUFACTURING METHOD

METHOD FOR MANUFACTURING CURVED-SURFACE DETECTOR, AND CURVED-SURFACE DETECTOR MANUFACTURED USING THE MANUFACTURING METHOD

机译:制造弯曲表面检测器的方法,以及使用制造方法制造的弯曲表面检测器

摘要

A method of manufacturing a curved-surface detector includes: slimming a sensor substrate having photoelectric devices arranged therein to a predetermined thickness; seating the sensor substrate slimmed to the predetermined thickness on a jig curved so as to have a curved-surface shape such that the sensor substrate is curved so as to have a curved-surface shape; and joining a flexible scintillator substrate configured to emit light when being struck by radiation to an upper surface of the sensor substrate such that curvature of the sensor substrate curved so as to have a curved-surface shape by the jig is maintained.
机译:制造弯曲表面检测器的方法包括:减肥,传感器基板具有布置在其中的光电器件到预定厚度;将传感器基板置于夹具上的预定厚度,以便具有弯曲表面形状,使得传感器基板弯曲以具有弯曲表面形状;并加入柔性闪烁体基板,该闪烁体基板被配置为在传感器基板的上表面撞击时发光,使得传感器基板的弯曲弯曲以便通过夹具具有弯曲表面形状。

著录项

  • 公开/公告号US2021074760A1

    专利类型

  • 公开/公告日2021-03-11

    原文格式PDF

  • 申请/专利权人 TOVIS CO. LTD.;

    申请/专利号US201816763233

  • 发明设计人 YONG BEOM KIM;

    申请日2018-11-05

  • 分类号H01L27/146;

  • 国家 US

  • 入库时间 2022-08-24 17:37:44

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