A TEST ARRANGEMENT, AN AUTOMATED TEST EQUIPMENT AND A METHOD FOR TESTING A DEVICE UNDER TEST COMPRISING AN ANTENNA

摘要

An embodiment according to the present invention is a test arrangement for testing a DUT comprising an antenna. The test arrangement comprises a DUT-location and a probe, which comprises two conductors. The test arrangement is configured to position the probe in a proximity of the DUT-location, such that the probe is in a reactive near-field region of an antenna element of the DUT, when the DUT is placed in the DUT-location, for example, in a DUT-socket or placed in a region in which the DUT is contacted by probes.