首页> 外国专利> ION BEAM IRRADIATION SYSTEM, ION BEAM PURITY MEASUREMENT METHOD, ION BEAM PURITY MEASUREMENT DEVICE, AND ION BEAM PURITY MEASUREMENT PROGRAM

ION BEAM IRRADIATION SYSTEM, ION BEAM PURITY MEASUREMENT METHOD, ION BEAM PURITY MEASUREMENT DEVICE, AND ION BEAM PURITY MEASUREMENT PROGRAM

机译:离子束辐射系统,离子束纯度测量方法,离子束纯度测量装置和离子束纯度测量程序

摘要

This ion beam irradiation system 1, which comprises an ion source 2 that extracts ions, a linear accelerator 4 and a circular accelerator 5 that accelerate the ions to generate an ion beam, an irradiation device 8 that performs irradiation with the ion beam accelerated by the accelerator, and a control device 10 that controls the accelerator and the irradiation device, comprises: a dose detection device 13 that detects the dose of the ion beam accelerated by the accelerator; a current detection device 14 that detects a current of the ion beam that has passed through the dose detection device; and a measurement processing unit 31 that measures the purity of the ion beam on the basis of a dose detection value of the dose detection device and a current detection value of the current detection device. Accordingly, impurity ions having the same mass-to-charge ratio as a target ion type in the irradiation with the ion beam can be detected.
机译:该离子束照射系统1包括提取离子,线性加速器4和圆形加速器5的离子源2,该离子源2加速离子以产生离子束的照射装置8,其与离子束加速的加速器和控制加速器和辐射装置的控制装置10包括:剂量检测装置13,其检测由加速器加速的离子束的剂量;电流检测装置14检测已经通过剂量检测装置的离子束的电流;和测量处理单元31基于剂量检测装置的剂量检测值和电流检测装置的电流检测值来测量离子束的纯度。因此,可以检测具有与与离子束照射中的靶离子型相同的质量 - 电荷比的杂质离子。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号