首页> 外国专利> Surface defect detection device, surface defect detection method, and steel manufacturing method

Surface defect detection device, surface defect detection method, and steel manufacturing method

机译:表面缺陷检测装置,表面缺陷检测方法和钢制造方法

摘要

PROBLEM TO BE SOLVED: To provide a surface defect detecting device and a surface defect detecting method capable of accurately detecting a surface defect. SOLUTION: The surface defect detection method according to the present invention is a first or first method from a difference image generation step of generating a difference image between a first image and a second image, and a bright part and a dark part of the difference image. The combination of the bright part and the dark part of the convex portion in the inspection target part is extracted and extracted based on the arrangement of the bright part and the dark part along the predetermined direction of the difference image corresponding to the irradiation direction of the illumination light of the second irradiation means. It is characterized by including a surface defect detection step of detecting a surface defect based on the brightness of the positions of the first image and the second image corresponding to the positions of the bright and dark areas. [Selection diagram] FIG. 9
机译:要解决的问题:提供一种表面缺陷检测装置和能够精确地检测表面缺陷的表面缺陷检测方法。解决方案:根据本发明的表面缺陷检测方法是来自在第一图像和第二图像之间产生差异图像的差异图像生成步骤的第一或第一方法,以及差错图像的亮部分和暗部分。在检查目标部分中的明亮部分和凸部的暗部的组合是基于明亮部分和暗部的布置沿着对应于照射方向的差分图像的预定方向的亮部分和暗部的布置来提取和提取第二辐射装置的照明光线。其特征在于,包括基于第一图像的位置的亮度和对应于明亮和暗区域的位置的第二图像的亮度来检测表面缺陷的表面缺陷检测步骤。 [选择图]图。 9.

著录项

  • 公开/公告号JP2021032711A

    专利类型

  • 公开/公告日2021-03-01

    原文格式PDF

  • 申请/专利权人 JFEスチール株式会社;

    申请/专利号JP20190153368

  • 发明设计人 楯 真沙美;大野 紘明;

    申请日2019-08-26

  • 分类号G01N21/952;

  • 国家 JP

  • 入库时间 2022-08-24 17:25:03

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号