A Machine for the placement of wafers in the cartridges, with previous test and Elimination of Defective cartridges.

• 1. 晶片盒、将晶片布置在晶片盒中的方法、晶片保护板和保护晶片的方法 [P] . 中国专利： CN107665844B . 2021.10.08
• 2. 晶片盒、将晶片布置在晶片盒中的方法、晶片保护板和保护晶片的方法 [P] . 中国专利： CN107665844A . 2018-02-06
• 3. Testing semiconducting wafers involves electrically testing each chip on each wafer to identify sub-area with most wafers with more defective chips in sub-area than in surrounding area [P] . 德国专利： DE10036961A1 . 2001-08-16

  机译： 测试半导体晶片涉及对每个晶片上的每个芯片进行电学测试，以识别子区域，其中大多数晶片的子区域中的缺陷芯片数量比周围区域多

• 4. device for testing durability of paper cartridges. [P] . SU75820A1 . 1948-11-30

  机译： 用于测试墨盒耐用性的设备。

• 5. APPARATUS FOR TESTING CARTRIDGES. [P] . 美国专利： US639432A . 1899-12-19

  机译： 测试心律的仪器。

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• 3. Use of CFCs as internal standards for measurements of non-methane VOCs sampled onto solid adsorbent cartridges. [D] . Karbiwnyk, Christine Marie. 2001
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• 5. Optical Pickup Standardization of Optical Disk Cartridges. [O] . Yoshinobu Mitsuhashi 1998
• 6. Test Design Plan (TDP) for the Production Qualification Testing (PQT) of the 81mm M984/M983 High Explosive (HE) Cartridges. [R] . Wood, G. E. 1992

• 1. Presentation of Empirical Equations for Estimating Internal Friction Angle of GW and GC Soils in Mashhad, Iran Using Standard Penetration and Direct Shear Tests and Comparison with Previous Equations [J] . Pouya Salari ,Gholam Reza Lashkaripour ,Mohammad Ghafoori . 地质学期刊（英文） . 2015,第5期
• 2. Optimal Actuator Placement and Active Vibration Control of Over-Actuated Motion System in the Wafer Stage [J] . Jing Wang ,Ming Zhang ,Yu Zhu . 北京理工大学学报：英文版 . 2020,第1期
• 3. Magnetic resonance imaging appearance and changes on intracavitary Gliadel wafer placement:A pilot study [J] . Rivka R Colen ,Pascal O Zinn ,Saman Hazany . 世界放射学杂志：英文版（电子版） . 2011,第11期
• 4. MICROBRIDGE TESTING OF YOUNG'S MODULUS AND RESIDUAL STRESS OF NICKEL FILM ELECTROPLATED ON SILICON WAFER [J] . Y.Zhou ,C.S.Yang ,J.A. Chen . 金属学报：英文版 . 2004,第3期
• 5. 非掺杂LEC砷化镓抛光晶片表面缺陷及晶体缺陷研究 [C] . 朱蓉辉 ,曾一平 ,卜俊鹏 . 第十四届全国化合物半导体材料、微波器件和光电器件学术会议 . 2006
• 6. 基于机器视觉的PZT晶片缺陷检测系统 [A] . 邹建男 . 2015