首页> 外国专利> Interference- or combined interference-schlieren apparatus with unusually large measuring field

Interference- or combined interference-schlieren apparatus with unusually large measuring field

机译:干扰场或组合干扰场的仪器,其测量场非常大

摘要

714,340. Interferometers. ZOBEL, T. July 23, 1951 [July 24, 1950], No. 17365/51. Class 97(1) To obtain a large measuring field in an interferometer of the Nach-Zchinder type combined, if desired with a Schlierin device, the measuring beam is enlarged, for example, by the aid of a concave parabolic mirror of high quality and after passage through the field to be measured is concentrated to its original size, for example,'by a second similar mirror; the comparison beam with which interference takes place may or may not be enlarged and is suitably compensated for any differences of path between the beams other than those due to the field. In a modification a single mirror is used, and the device may be employed to test the surface accuracy of a large spherical concave mirror. Fig. 2 shows an arrangement in which both the measuring and comparison beams are enlarged. Light from a source is focused by a lens 2 on a semi-transparent mirror 3 from which the comparison beam is reflected to a concave parabolic mirror 11 which renders the beam parallel and directs it to a second mirror 12 from which the beam is focused by mirror 13 and lens 14 on a semi-transparent mirror 8. The measuring beam, transmitted by the mirror 3 is focused by lens 4 on a mirror 5 and is similarly focused on mirror 8 by parabolic mirrors 6, 7 after passing the field 19 to be measured. The interference effects between the two beams is observed on screen 10. Part of the second beam may be intercepted by a semi-transparent reflector 15 to pass the edge 18 of a Schlierin device. A modification is described in which the axis of the mirrors 11, 12, 6 and 7 are parallel but not coincident. Fig. 3 shows a similar arrangement in which only the measuring beam is enlarged. Light from the source 1 reflected by the transparent mirror 3 is directed to the transparent mirror 11 by reflectors, 14, 15 and 16 while the transmitted measuring beam, focused by a concave mirror 4 on a small mirror 5 is reflected through the field, e.g. a wind tunnel, enclosed between glass plates 21, by the concave mirror 6 and is directed upon the mirror 11 by mirrors 7, 8, 9, and 10. As before a Schlierin edge 20 may also be incorporated in the apparatus. A compensator 22 adjusts the comparison beam for the thickness of the plates 21. Modified arrangements for producing the comparison beam using lenses of concave mirrors in addition to plane mirrors is also described. Fig. 10 shows a system employing only one large parabolic mirror. Light from the source 1 transmitted by semi-reflector 3 passes to mirrors 9, 10, is focused by lens 11 reflected back on itself by a concave mirror 12 to return to the reflector 3, there to interfere with the measuring beam. The latter is reflected by the mirror 3, focused on a mirror 5 by lens 4, rendered parallel by the mirror 6 and passes the field enclosed between glass plates 16. The beam then reaches a plane semi-transparent reflector 7 and is partially transmitted to form a shadowgraph visible on a screen 8, and partially reflected back to the mirror 6 and thence to the mirror 3. the interference pattern being visible on a screen 14. The reflector 7 may be totally reflecting, the lens 4 may be replaced by a concave mirror, and the lens and mirror 10, 11 replaced by a plane mirror. The system may be combined with a Schlierin system. By using as the plane reflector 7 a truly planar surface such as a liquid, the system may be used to determine the surface accuracy of a large spherical mirror by placing the mirror in position of the mirror 6 of Fig. 10.
机译:714,340。干涉仪。 ZOBEL,T.1951年7月23日[1950年7月24日],编号17365/51。 97(1)类为了在Nach-Zchinder型干涉仪中获得较大的测量场,如果需要,可将其与Schlierin装置结合使用,例如,借助高质量的凹形抛物面镜来扩大测量光束。在穿过待测场之后,例如通过第二个类似的镜子将其集中到其原始尺寸。与之发生干涉的比较光束可能会放大,也可能不会放大,并且会适当补偿光束之间的任何路径差异,而不是由于磁场造成的。在一个变型中,使用单个反射镜,并且该装置可以用于测试大的球形凹面镜的表面精度。图2示出了其中测量光束和比较光束都被放大的布置。来自光源的光由透镜2聚焦在半透明镜3上,比较光束从半透明镜3反射到凹抛物面镜11,该抛物面镜使光束平行,然后将其导向第二镜12,光束从第二镜12聚焦。反射镜13和透镜14位于半透明反射镜8上。由反射镜3透射的测量光束由透镜4聚焦在反射镜5上,并且类似地,在通过场19之后,由抛物面反射镜6、7聚焦在反射镜8上。被测量。在屏幕10上观察到两个光束之间的干涉效果。第二光束的一部分可以被半透明的反射器15拦截以通过Schlierin装置的边缘18。描述了一种变型,其中反射镜11、12、6和7的轴线平行但不重合。图3示出了类似的布置,其中仅测量光束被放大。来自光源1的由透明镜3反射的光通过反射器14、15和16被引导到透明镜11,而被凹面镜4聚焦在小镜5上的透射的测量光束通过例如场反射。在玻璃板21之间由凹面反射镜6包围的风洞由反射镜7、8、9和10引导到反射镜11上。如前所述,也可以将Schlierin边缘20结合在装置中。补偿器22针对板21的厚度调整比较光束。还描述了用于使用平面镜之外的凹面镜的透镜产生比较光束的修改布置。图10示出了仅采用一个大抛物面镜的系统。来自光源1的,由半反射器3透射的光到达反射镜9、10,被凹面镜12反射回自身的透镜11聚焦,返回到反射器3,在那里干涉测量光束。后者由反射镜3反射,由透镜4聚焦在反射镜5上,并由反射镜6平行,并通过封闭在玻璃板16之间的场。然后,光束到达平面半透明反射器7,并部分透射至形成在屏幕8上可见的阴影图,并部分反射回反射镜6,然后反射到反射镜3。干涉图样在屏幕14上可见。反射镜7可以全反射,透镜4可以用反射镜代替。凹面镜,并将镜片和反光镜10、11换成平面镜。该系统可以与Schlierin系统结合。通过使用诸如液体的真正平坦的表面作为平面反射器7,该系统可以用于通过将镜子放置在图10的镜子6的位置来确定大型球面镜子的表面精度。

著录项

  • 公开/公告号GB714340A

    专利类型

  • 公开/公告日1954-08-25

    原文格式PDF

  • 申请/专利权人 THEODOR ZOBEL;

    申请/专利号GB19510017365

  • 发明设计人

    申请日1951-07-23

  • 分类号G02B27/54;

  • 国家 GB

  • 入库时间 2022-08-23 23:46:52

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号