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Method of and device for the photoelectric control of length-ruling and length-measuring machines

机译:测长机和测长机的光电控制方法及装置

摘要

1,147,467. Photo-electric length measurement using radiation interferences. CARL ZEISS JENA VEB. May 26, 1966, No.23587/66. Heading G1A. In a machine which rules or measures lengths by photo-electrically scanning radiation interferences the source of radiation is tuned to a wavelength which is an integral fraction of a statutory unit of length; the desired wavelength may be produced by an interferometric or beat-frequency comparison with a standard wavelength radiation source. Two interference plates 2 are fixed to the bed and slide of the machine respectively and as the slide moves the interferences are counted by a photo-electric receiver 3 and counter 4 as a measure of the slide's movement. The source of radiation which is a laser, is compared with a standard krypton source 8 by an interferometer system 10, comprising two inter-connected Fabry-Perot interferometers, which automatically tunes the laser to the desired wavelength. Tuning may be effected by adjusting the pressure of the laser. Alternatively one laser may be tuned to the standard source and a second laser tuned to the desired wavelength by noting the beat-frequency of the pair.
机译:1,147,467。利用辐射干扰测量光电长度。卡尔·蔡司·珍娜·维伯。 1966年5月26日,编号23587/66。标题G1A。在通过光电扫描辐射干扰来控制或测量长度的机器中,辐射源被调谐到一个波长,该波长是长度的法定单位的整数分之一。可以通过与标准波长辐射源进行干涉测量或拍频比较来产生所需的波长。两个干涉板2分别固定在机器的底座和滑架上,并且当滑架移动时,通过光电接收器3和计数器4对干涉进行计数,以作为滑架运动的量度。干涉仪系统10将作为激光的辐射源与标准k源8进行比较,该干涉仪系统包括两个相互连接的法布里-珀罗干涉仪,它们自动将激光调谐到所需的波长。可以通过调整激光的压力来进行调谐。或者,可以通过注意一对激光器的拍频,将一个激光器调谐到标准光源,将第二个激光器调谐到所需波长。

著录项

  • 公开/公告号GB1147467A

    专利类型

  • 公开/公告日1969-04-02

    原文格式PDF

  • 申请/专利权人 VEB CARL ZEISS JENA;

    申请/专利号GB19660023587

  • 发明设计人 JOHANNES HERTZ;ROLF RIEKHER;

    申请日1966-05-26

  • 分类号G01B9/02;G01B11/14;

  • 国家 GB

  • 入库时间 2022-08-23 11:52:31

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