APPARATUS FOR PROVIDING SHORT BUNCHES OF CHARGED MOLECULAR,ATOMIC,OR NUCLEAR PARTICLES

• 1. 一种专用于基态钠铯分子制备的原子束预减速装置及方法 [P] . 中国专利： CN112469190B . 2021.08.13
• 2. 一种专用于基态钠铯分子制备的原子束预减速装置及方法 [P] . 中国专利： CN112469190A . 2021-03-09
• 3. Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus [P] . 美国专利： US8657962B2 . 2014-02-25

  机译： 粒子去除方法，粒子去除装置，原子力显微镜及带电粒子束装置

• 4. Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus [P] . 美国专利： US2008307866A1 . 2008-12-18

  机译： 粒子去除方法，粒子去除装置，原子力显微镜和带电粒子束装置

• 5. PARTICLE REMOVAL METHOD, MINUTE TWEEZER APPARATUS, ATOMIC FORCE MICROSCOPE, AND CHARGED PARTICLE BEAM APPARATUS [P] . 日本专利： JP2008311521A . 2008-12-25

  机译： 颗粒去除方法，镊子钳，原子力显微镜和带电粒子束设备

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