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ATOM PROBE FIELD MICROSCOPE HAVING MEANS FOR SEPARATING THE IONS ACCORDING TO MASS

机译:具有用于根据离子分离离子的原子探针场显微镜

摘要

1,180,894. Ion beam tubes. NATIONAL RESEARCH DEVELOPMENT CORP. 18 June, 1968 [20 June, 1967], No. 28944/68. Heading HID. In a field ion microscope an ion beam corresponding to a particular atom of the specimen 12 is selected by pairs of deflection plates 18 to pass through an aperture in the image screen 16 for subsequent analysis in a mass spectrometer 25. Additional deflection plates may be provided to ensure normal incidence of the selected ion beam on the aperture. The imaging gas is preferably helium at a pressure of a few microns with the electrical field applied to the specimen 12 then slowly increased, the flux of helium ions detected at 28 suddenly ceases when the selected atom is field desorbed or evaporated. The selected. atom then leaves the specimen site as an ion which passes through the aperture in the image screen for analysis in the mass spectrometer and detection at 30 or 32. The detectors 28, 30 and 32 are adjustable in position. The helium gas may alternatively, or in addition, be recorded by virtue of the beam of neutral atoms which passes through the aperture. In a modification (Fig. 3), the detector section of the mass spectrometer comprises a venetianblind type electron multiplier and output display screen. In a further modification (Fig. 4), the deflection plates are dispensed with and the microscope section 10 (50) includes a bellows device (52) which may be used to tilt the specimen and an associated ring electrode (56) in any desired direction, the tilting motion being restrained by a spherical joint (54). The microscope is associated in this modification with a time-of-flight mass spectrometer (64). The helium supply may be interrupted before the field desorption process is initiated, e.g. by applying a voltage pulse to the specimen or to the associated ring electrode. During adjustment of the image the gas pressure may be maintained by either, closing off the pumping system or operating in a dynamic gas mode with the ring electrode associated with the specimen having a small orifice such that the gas pressure is higher in the vicinity of the specimen than in the rest of the instrument. The size of the aperture in the image screen may be adjusted by utilizing an array or revolving plate of various size holes or an iris type variable aperture. The aperture may also be of oblong shape.
机译:1,180,894。离子束管。国家研究发展公司,1968年6月18日[1967年6月20日],第28944/68号。标题HID。在现场离子显微镜中,通过成对的偏转板18选择与样品12的特定原子相对应的离子束,以使其穿过图像屏幕16中的孔,以便随后在质谱仪25中进行分析。可以提供另外的偏转板。以确保所选离子束在孔上的垂直入射。当所选择的原子是场解吸或蒸发成像气体优选在与电场几微米的氦压力施加到样本12然后缓慢地增加,氦离子的通量在28检测突然停止。选定的。然后,原子以离子形式离开样品部位,该离子穿过图像屏幕上的孔以在质谱仪中进行分析并在30或32处进行检测。检测器28、30和32的位置可调。氦气可替代地或另外地借助于穿过孔的中性原子束来记录。在一个改进方案中(图3),质谱仪的检测器部分包括一个百叶窗型电子倍增器和输出显示屏。在进一步的修改中(图4),省去了偏转板,并且显微镜部分10(50)包括波纹管装置(52),该波纹管装置(52)可用于以任何期望的方式倾斜样本和相关的环形电极(56)。方向,倾斜运动受到球形接头(54)的限制。在此修改中,显微镜与飞行时间质谱仪(64)关联。在开始场解吸过程之前,例如,氦气供应可能会中断。通过向样品或相关的环形电极施加电压脉冲。在调整图像期间,可以通过关闭泵系统或在动态气体模式下以与样品相关的环形电极具有小孔的方式来维持气压,以使气体压力在样品附近变得更高。样品比仪器的其余部分。可以通过利用各种尺寸的孔的阵列或旋转板或可变光圈来调节图像屏幕中的孔的尺寸。孔也可以是长方形的。

著录项

  • 公开/公告号US3602710A

    专利类型

  • 公开/公告日1971-08-31

    原文格式PDF

  • 申请/专利权人 RESEARCH CORP.;

    申请/专利号USD3602710

  • 发明设计人 ERWIN W. MUELLER;

    申请日1969-05-07

  • 分类号H01J39/34;

  • 国家 US

  • 入库时间 2022-08-23 09:02:17

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