Test facility without interruption for data-processing system - has maintenance unit transferring test data to registers

摘要

A separate test path is provided to connect the maintenance unit with buffer circuits and to transfer data between the maintenance unit and the buffer circuits. These buffer circuits select an addressed register in accordance with test data received, while the system is operating as a computer, and conduct a test of the selected register simultaneously with the processing of data, when it is not required for computer operation. The test path can contain a data collecting line which is used to record data in and read data from a number of registers. The maintainance unit can be manually or program controlled.