首页> 外国专利> METHOD AND APPARATUS FOR TESTING BATCH FABRICATED MAGNETIC HEADS DURING MANUFACTURE UTILIZING MAGNETIC FIELDS GENERATED BY OTHER MAGNETIC HEADS

METHOD AND APPARATUS FOR TESTING BATCH FABRICATED MAGNETIC HEADS DURING MANUFACTURE UTILIZING MAGNETIC FIELDS GENERATED BY OTHER MAGNETIC HEADS

机译:在制造过程中利用其他磁头产生的磁场测试分批制造的磁头的方法和装置

摘要

Magnetic head elements are batch fabricated on areas of a substrate. During manufacture, and before final separation and processing of the areas into discrete multi-track magnetic heads, defective areas are identified for removal. An electric signal source subjects the head areas to a magnetic field which is detected as electric current in each head area. The detected current value in acceptable head areas falls within a predefined range. All head areas having a current outside the range are defined as defective. The magnetic field emanates from one set of head areas in the vicinity of another set of head areas being tested.
机译:磁头元件被批量制造在基板的区域上。在制造过程中,以及在将这些区域最终分离和处理成离散的多磁道磁头之前,要确定有缺陷的区域以进​​行去除。电信号源使头部区域经受磁场,该磁场被检测为每个头部区域中的电流。在可接受的头部区域中检测到的电流值落在预定范围内。电流超出该范围的所有磁头区域均被定义为有缺陷。磁场从正在测试的另一组头部附近的一组头部发出。

著录项

  • 公开/公告号DE000002226366A

    专利类型

  • 公开/公告日1972-12-07

    原文格式PDF

  • 申请/专利权人 IBM;

    申请/专利号DE2226366A

  • 发明设计人

    申请日1972-05-30

  • 分类号G11B5/42;

  • 国家 DE

  • 入库时间 2022-08-23 07:15:17

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