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BIAS CORRECTED MEASURING INSTRUMENT

机译:偏置校正的测量仪器

摘要

A multiple coordinate measuring system of the type wherein a probe explores some feature of a part being measured and acts through a transducer or similar device to record a measurement on a chart or other record. Both the part and probe are moved along coordinated and predetermined paths so that the probe remains a fixed distance from the surface of the part being measured when the theoretical dimension corresponds to the actual dimension of the part. Detected deviations of the probe from the fixed distance represent deviations of the actual dimension from the theoretical dimension and are recorded on charts or other records. In one embodiment of the invention of this application, the actual positions of both the part being measured and the probe during measurement are continuously detected and deviations of the part and measuring instrument from their theoretical positions are detected and employed to correct the detected signals from the probe indicating the deviation of the probe from the fixed distance.
机译:这种类型的多坐标测量系统,其中探针探查被测零件的某些特征,并通过换能器或类似设备起作用,以将测量值记录在图表或其他记录上。零件和探针都沿着协调的预定路径移动,因此,当理论尺寸与零件的实际尺寸相对应时,探针与被测零件的表面保持固定的距离。检测到的探头与固定距离的偏差代表实际尺寸与理论尺寸的偏差,并记录在图表或其他记录中。在本申请的发明的一个实施例中,连续地检测被测量的零件和探头在测量过程中的实际位置,并检测零件和测量仪器与它们的理论位置的偏差,并将其用于校正来自传感器的检测信号。指示探针与固定距离的偏差。

著录项

  • 公开/公告号US3741659A

    专利类型

  • 公开/公告日1973-06-26

    原文格式PDF

  • 申请/专利权人 FELLOWS GEAR SHAPER COUS;

    申请/专利号USD3741659

  • 发明设计人 JONES JUS;

    申请日1970-06-19

  • 分类号G01B9/02;G01B3/14;G01B11/00;

  • 国家 US

  • 入库时间 2022-08-23 06:27:27

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