Rapid fault finding in large circuit arrangements - involves subdivision of circuit into functionally classified sections

摘要

The switching arrangement to be checked is subdivided for high-speed diagnosis into functionally classified sections. These sections have their proper functions checked by measurement of d.c. and/or a.c. and/or pulse voltage values at key points in the sections. The duly checked functions of the individual sections are displayed by the use of luminous diodes. Appropriately rated series resistors can be used to connect to the luminous diodes d.c. voltages which are tapped at the key points. The amount of a current can be measured indirectly by way of a voltage drop at a small series resistor.