首页> 外国专利> Optical device for measuring small deformations - uses birefringent phase difference measurements to detect movement

Optical device for measuring small deformations - uses birefringent phase difference measurements to detect movement

机译:用于测量小变形的光学设备-使用双折射相差测量来检测运动

摘要

A low power laser (1) generates a monochromatic light which passes through optical lenses (2, 3) to a separator (5) consisting of semi transparent (5) and reflecting (5') mirrors. Two parallel light beams are obtained for directing towards a transparent sample (6) on which is fixed a gauge (7) and two slits (8). The narrow beams pass to a measuring system comprising a polariser (9) and a linear birefringent system (10). It also includes an analyser of elliptical vibrations (11). The optical signals are directed to two photocells (16) for application to the input of a differential amplifier (17). Movement causes a different signal which is recorded (18). Measurements are independent of the movement of the support assembly.
机译:低功率激光器(1)产生单色光,该单色光穿过光学透镜(2、3)到达由半透明(5)和反射(5')反射镜组成的分隔器(5)。获得两个平行光束以将其导向透明样品(6),在透明样品上固定有量规(7)和两个狭缝(8)。窄光束通过测量系统,该系统包括偏振器(9)和线性双折射系统(10)。它还包括一个椭圆振动分析仪(11)。光信号被引导到两个光电管(16),以施加到差分放大器(17)的输入。运动会导致记录一个不同的信号(18)。测量与支撑组件的移动无关。

著录项

  • 公开/公告号FR2244156A1

    专利类型

  • 公开/公告日1975-04-11

    原文格式PDF

  • 申请/专利权人 ANVARFR;

    申请/专利号FR19730033061

  • 发明设计人

    申请日1973-09-14

  • 分类号G01B11/16;G02F1/01;

  • 国家 FR

  • 入库时间 2022-08-23 03:46:33

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