首页> 外国专利> method and apparatus for measurement of stress in a band under tension and their applications, in particular for the measurement of the state of planeite such a band

method and apparatus for measurement of stress in a band under tension and their applications, in particular for the measurement of the state of planeite such a band

机译:张力下测量带中应力的方法和装置及其应用,特别是测量这种带的平面状态

摘要

A method and apparatus for measuring a mechanical characteristic of a band subjected to tension. A disturbance is produced, for example by a hammer, transversely of the band and there is measured the time that the disturbance takes to travel through a predetermined distance along the band. This measurement is related to the value of the tensile stress in the band. In this way planarity defects in the band can be detected by comparison of the times the disturbance takes to travel in different regions of the band.
机译:一种用于测量受拉带的机械特性的方法和设备。在带的横向产生例如扰动的干扰,并测量扰动沿着带传播预定距离所花费的时间。该测量与带中的张应力值有关。这样,可以通过比较干扰在频带的不同区域中传播所花费的时间来检测频带中的平面缺陷。

著录项

  • 公开/公告号BE841335A

    专利类型

  • 公开/公告日1976-11-03

    原文格式PDF

  • 申请/专利权人

    申请/专利号BE19760166615

  • 发明设计人

    申请日1976-04-30

  • 分类号G01N;

  • 国家 BE

  • 入库时间 2022-08-23 02:59:04

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