首页> 外国专利> Trimming process for thin-film resistance networks - measures port resistances cyclically between trimming steps to approach wanted value from below

Trimming process for thin-film resistance networks - measures port resistances cyclically between trimming steps to approach wanted value from below

机译:薄膜电阻网络的修整过程-在修整步骤之间循环测量端口电阻,以从下面达到所需值

摘要

The trimming process, for thin-film resistance networks, has the individual resistors in the symmetric or asymmetric Pi network of resistors adjusted cyclically according to the results obtained by making total resistance measurements between the Pi network three ports. In this way the required resistances for the three ports are gradually approached under the guidance of a set programme and by making resistance measurements between each trimming stage. The adjustments are made such that the total required resistance is approached from below. The method can also be used for thin-film hybrid circuits.
机译:对于薄膜电阻网络,微调过程中,根据在Pi网络的三个端口之间进行总电阻测量而获得的结果,周期性地调整电阻器对称或不对称Pi网络中的各个电阻。这样,在设定程序的指导下并通过在每个微调阶段之间进行电阻测量,逐渐接近了三个端口所需的电阻。进行调整,以便从下方接近所需的总电阻。该方法也可以用于薄膜混合电路。

著录项

  • 公开/公告号DE2041872B2

    专利类型

  • 公开/公告日1976-03-11

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE19702041872

  • 发明设计人

    申请日1970-08-24

  • 分类号H01C17/22;

  • 国家 DE

  • 入库时间 2022-08-23 02:09:00

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