首页> 外国专利> An interferometer system for measuring distance changes between two structural components of a device

An interferometer system for measuring distance changes between two structural components of a device

机译:一种用于测量设备的两个结构部件之间的距离变化的干涉仪系统

摘要

An interferometer system for measuring straightness including a light source for producing a beam of light, preferably a two frequency laser with the two frequency components linearly polarized and orthogonal to one another, the light beam being directed through a Wollaston prism where the beam is split into two separate paths which deviate, in opposite paths, from the original beam direction by a small angle. The two separate beams are transmitted over two separate paths to associated ones of two separate reflective surfaces which are mounted in a mutually fixed relationship and at an angle to each other. The two beams are reflected back into the prism from the associated reflective surfaces where they are recombined. Photodetector means are provided for detecting any changes in the fringes resulting from a change in one optical path length relative to other optical path length as the two mirrors move relative to the prism, said change in path lengths resulting from deviations from straightness in such movement. A dual system is disclosed for measuring rotational motion, i.e., roll.
机译:一种用于测量直线度的干涉仪系统,其包括用于产生光束的光源,优选地是具有两个频率分量线性偏振且彼此正交的双频激光器,该光束被引导通过沃拉斯顿棱镜,在该棱镜中光束被分成两个分开的路径,它们以相反的路径与原始光束方向偏离一个小角度。两条分开的光束通过两条分开的路径传输到两个分开的反射面中的相关反射面,它们以相互固定的关系并彼此成角度安装。这两个光束从相关的反射表面反射回棱镜中,在此它们被重新组合。提供光检测器装置,用于检测由于两个反射镜相对于棱镜移动时一个光程长度相对于另一光程长度的变化而导致的条纹的任何变化,所述光程长度的变化是由于这种移动的笔直度的偏差而引起的。公开了一种用于测量旋转运动即滚动的双系统。

著录项

  • 公开/公告号DE2322804B2

    专利类型

  • 公开/公告日1976-03-04

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE19732322804

  • 发明设计人

    申请日1973-05-05

  • 分类号G01B9/02;

  • 国家 DE

  • 入库时间 2022-08-23 02:07:31

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号