Faults detection and location method - is for system units of complex electronic equipment

摘要

Individual components (B) and/or circuits (S) mounted on circuit boards and interconnected, are, after a system unit incorrect functioning is detected, individually and consecutively subjected to function tests during which all components and/or circuits are disconnected from each other and, except for the tested item, from supply and signal voltages which are separately applied, and the function test results evaluated by a test unit connected to the components and/or circuits on the circuit board. A contact element (41) is typically in the form of a flexible wire contacting one unit (L1) and passing through an insulating track in the other unit (L2).