首页> 外国专利> Testing for foreign particles in non-transparent encapsulated housings - voltage applied to contact parts to show up conductive bodies

Testing for foreign particles in non-transparent encapsulated housings - voltage applied to contact parts to show up conductive bodies

机译:测试非透明密封外壳中的异物-施加到接触部件的电压以显示导电体

摘要

The testing is for impurities, foreign particles, in non-transparent housings in which contacts, particularly telephone contacts, have been encapsulated using air sealing. The housing, through the testing device, is vibrated and observation is made as to whether there is current flow between opened contacts to which a voltae has been applied. A high voltage source is applied to the contact springs, with the amplitude of the applied voltage such that arcing would not take place between opened contacts in the absence of foreign particles. A current limiter may be inserted in the circuit to limit the arcing current and its duration.
机译:该测试是针对不透明的外壳中的杂质,异物颗粒进行的,其中触点(尤其是电话触点)已通过空气密封封装。通过测试装置使壳体振动,并观察在已施加电压的断开触点之间是否有电流流动。高压源被施加到接触弹簧上,施加的电压幅度使得在没有异物的情况下,断开的触点之间不会产生电弧。可以将限流器插入电路中以限制电弧电流及其持续时间。

著录项

  • 公开/公告号DE2460244A1

    专利类型

  • 公开/公告日1976-06-24

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE19742460244

  • 发明设计人 BROCKELBERTOLDDIPL.-PHYS.;

    申请日1974-12-19

  • 分类号G01R31/00;

  • 国家 DE

  • 入库时间 2022-08-23 02:03:17

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