首页> 外国专利> Secondary-ion mass spectroscopy and residual gas analysis appts. - having electrostatic lens system with cylindrical section(s) which also acts as ion emitting electrode

Secondary-ion mass spectroscopy and residual gas analysis appts. - having electrostatic lens system with cylindrical section(s) which also acts as ion emitting electrode

机译:二次离子质谱和残留气体分析仪器。 -具有带圆柱形截面的静电透镜系统,该圆柱形透镜也可用作离子发射电极

摘要

Appts. suitable for carrying out secondary ion mass spectroscopy and residual gas analysis, includes an electrostatic lens system with at least one cylindrical section up stream of a mass filter. The cylindrical section is in the form of an electrode which can act as an ion source. Pref. the electrostatic lens system includes several cylindrical section sand that the section immediately upstream of the mass filter is in the form of an electrode for the ion source. The same appts. with all attached auxiliaries can be used for residual gas analysis and the cost of separate appts. for this purpose is saved.
机译:Appts。适用于进行二次离子质谱和残留气体分析的系统包括静电透镜系统,该系统具有至少一个圆柱形的质量过滤器上游部分。圆柱形部分呈可充当离子源的电极的形式。首选静电透镜系统包括几个圆柱状的截面砂,在质量过滤器上游的截面呈离子源电极的形式。相同的应用程序。所有附属助剂均可用于残留气体分析和单独应用的费用。为此目的,已保存。

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