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A method for the production of mesa - and relevant spatial semiconductor structures with a local inhomogeneity in respect of their composition and apparatus for carrying out this method

机译:一种用于制造台面及相关空间半导体结构及其组成具有局部不均匀性的方法以及实施该方法的设备

摘要

Prodn. of structures with local inhomogeneities in their compsn. involves transport and deposition of a material by chemical gas transport reactions with parallel adjacent base plate (I) and auxiliary plate (II), one of which has a locally inhomogeneous surface. A temp. drop is developed between the 2 plates, to ensure transport in a given direction from one of the plates. The reactor is filled with a reaction or carrier gas. the plates are brought close together and shifted so that given points on (I) are covered by given points on (II) at least once, to give gas streams of given direction, compsn. and cross-section, at a distance between the surfaces of the 2 plates less than the min. of a point with homogeneous compsn. on the surface of (II). Used in semiconductor and radio electronics and integrated optic-electronics. The profile of the structures is regulated by repeated consecutive growth and etching stages in a single operation. The points on (II) are over 2 mum deep and consist of Ge, si, AIIIBV and AIIBVI cpds. or solid solns. of these cpds. surrounded by SiO2, quartz, Al2O3 or sapphire.
机译:产品组件中具有局部不均匀性的结构。涉及通过化学气体传输反应与平行的相邻基板(I)和辅助板(II)进行材料的传输和沉积,其中之一具有局部不均匀的表面。临时在两个板之间形成水滴,以确保从其中一个板沿给定方向运输。反应器充满反应或载气。板彼此靠近并移动,以使(I)上的给定点至少被一次(II)上的给定点覆盖,从而得到给定方向的气流。和横截面,两个板的表面之间的距离小于最小距离。具有均质compsn的点(II)的表面上。用于半导体和无线电电子以及集成光电子。通过在单个操作中重复的连续生长和蚀刻阶段来调节结构的轮廓。 (II)上的点深超过2微米,包括Ge,si,AIIIBV和AIIBVI cpds。或固体溶液。这些cpds。被SiO2,石英,Al2O3或蓝宝石包围。

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