首页> 外国专利> Photoelectric length measurement system - performs interpolation and derives control signals for interpolation by reference comparison (OE15.1.77)

Photoelectric length measurement system - performs interpolation and derives control signals for interpolation by reference comparison (OE15.1.77)

机译:光电长度测量系统-执行插值并通过参考比较(OE15.1.77)得出用于插值的控制信号

摘要

A method for measuring length involves photoelectric scanning of an incremental scale to generate two antiphase approx. sinusoidal signals (a, c) of wavelength corresponding to the scale divisions. A number of reference signals equally spaced in phase are derived from the scale divisions, and from these digital control signals for counters and display units are derived. During the time of operation of each digital control signal the instantaneous absolute magnitude of an associated measuring signal as compared with a selected reference signal is used to control a supplementary interpolation indicator.
机译:一种测量长度的方法涉及增量刻度的光电扫描,以产生两个反相的电流。波长的正弦信号(a,c)对应于标度划分。从标度划分中得出许多相位相等的参考信号,并从这些用于计数器和显示单元的数字控制信号中得出。在每个数字控制信号工作期间,与选择的参考信号相比,相关测量信号的瞬时绝对幅度用于控制辅助内插指示器。

著录项

  • 公开/公告号FR2331772A1

    专利类型

  • 公开/公告日1977-06-10

    原文格式PDF

  • 申请/专利权人 RIEDER HEINZ;

    申请/专利号FR19760033862

  • 发明设计人

    申请日1976-11-10

  • 分类号G01B7/02;

  • 国家 FR

  • 入库时间 2022-08-22 23:46:59

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