首页> 外国专利> Apparatus for measuring a deplacment in at least two dimensions which are orthogonal

Apparatus for measuring a deplacment in at least two dimensions which are orthogonal

机译:用于测量至少两个正交的位移的设备

摘要

Measuring apparatus comprises a probe having a stylus supported on a housing by a spring extending in a plane transverse to the axis of the stylus and allowing the stylus to pivot about a center lying on the axis and to move linearly in the direction of the axis. A sensor has fixed and movable parts off-set from the axis, the movable part being connected to the stylus by a transverse arm. The sensor senses both pivotal and axial movement, the pivotal movement corresponding to movement of the work- contacting end of the stylus transverse to the axis. At least one further sensor is provided to sense at least the axial movement of the stylus. An electrical network responsive to both sensor outputs is arranged to discriminate between transverse and axial movements of the stylus. Alternatively the sensors are arranged to give a single output for any movement of the stylus.
机译:测量设备包括具有探针的探针,该探针由弹簧支撑在壳体上,该弹簧在垂直于探针轴线的平面内延伸并且允许探针绕位于轴线上的中心枢转并沿轴线方向线性移动。传感器具有固定的和可移动的部件,该固定的和可移动的部件偏离轴线,该可移动的部件通过横臂连接到触针。传感器同时感测枢轴运动和轴向运动,该枢轴运动对应于测针的垂直于轴线的工作接触端的运动。设置至少一个另外的传感器以至少感测笔的轴向运动。响应于两个传感器输出的电网被布置为区分触针的横向和轴向运动。替代地,传感器被布置为针对触针的任何运动给出单个输出。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号