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Input magnitude comparator for quality control - is to determine differences for classifying semiconductor elements

机译:用于质量控制的输入幅度比较器-用于确定对半导体元件进行分类的差异

摘要

The arrangement for comparing discrete and predetermined values so as to determine the range in which the input magnitudes lie, as well as their sign, can be used to divide resistances and condensers into classes, as well as to classify semiconductor elements. The arrangement has impulse connections (17, 18, 19) fed from a generator (27) whose inlet is connected to a control device. When a signal is input (28) to the generator, pulses are fed to comparison units (1) for equal value number places, where comparison with pre-entered magnitudes (5) occurs. Each comparison unit incorporates a NOT-circuit (2) and two groups of AND circuits (3, 4). Two separate connected groups of OR circuits (7, 8) are linked to storage elements (9) connected to an address formulating unit (14).
机译:用于比较离散值和预定值以便确定输入幅度所处的范围及其符号的装置可用于将电阻和电容器分类,以及对半导体元件进行分类。该装置具有从发电机(27)馈送的脉冲连接(17、18、19),该发电机的入口连接到控制装置。当信号输入(28)到发生器时,将脉冲馈送到比较单元(1)的相等数值个数位置,在此处与预先输入的幅度(5)进行比较。每个比较单元都包含一个非电路(2)和两组与电路(3、4)。两个分开连接的或电路(7、8)的组链接到连接到地址制定单元(14)的存储元件(9)。

著录项

  • 公开/公告号FR2261658B1

    专利类型

  • 公开/公告日1978-05-05

    原文格式PDF

  • 申请/专利权人 MYAGKOV ALEXEI;

    申请/专利号FR19740005450

  • 发明设计人

    申请日1974-02-18

  • 分类号H03K5/00;B07C5/34;

  • 国家 FR

  • 入库时间 2022-08-22 21:49:36

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