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Input magnitude comparator for quality control - is to determine differences for classifying semiconductor elements
Input magnitude comparator for quality control - is to determine differences for classifying semiconductor elements
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机译:用于质量控制的输入幅度比较器-用于确定对半导体元件进行分类的差异
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摘要
The arrangement for comparing discrete and predetermined values so as to determine the range in which the input magnitudes lie, as well as their sign, can be used to divide resistances and condensers into classes, as well as to classify semiconductor elements. The arrangement has impulse connections (17, 18, 19) fed from a generator (27) whose inlet is connected to a control device. When a signal is input (28) to the generator, pulses are fed to comparison units (1) for equal value number places, where comparison with pre-entered magnitudes (5) occurs. Each comparison unit incorporates a NOT-circuit (2) and two groups of AND circuits (3, 4). Two separate connected groups of OR circuits (7, 8) are linked to storage elements (9) connected to an address formulating unit (14).
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