test facility omsætningsnøjagtigheden for a omsætterkredsløb with an analog and a digital digitalomsætter analogomsætter.

摘要

1324928 Analogue to digital and digital to analogue converters PHILIPS ELECTRONIC & ASSOCIATED INDUSTRIES Ltd 15 Nov 1971 [18 Nov 1970] 52949/71 Heading G4H A series arrangement of an A/D and D/A converter is tested over its entire amplitude range by a test signal formed from a high frequency signal of constant amplitude and a periodically amplitude-varying signal, the signal recovered from the output of the D/A converter being filtered to derive distortion products introduced by inaccuracies in the conversion, which are compared with a reference level. In the arrangement of Fig. 1 a test signal, generated by a sine wave oscillator 7 whose output is modulated in modulator 9 by a periodic stepped waveform from generator 8 is fed to an A/D-D/A converter arrangement 1. The test signal recovered from the converter arrangement 1 is demodulated by the stepped waveform from generator 8 in demodulator 17 and the high frequency signal is fed to filters 11, 12 to derive the high frequency signal plus accompanying noise S + N and also just the noise N. The noise signal N is compared with the signal plus noise S + N in comparator 15 and the signal plus noise S + N is compared with the reference level 18 in a comparator 14, outputs of either comparator 15 or 14 being fed by an OR gate 16 to provide a signal indicative of inaccuracies in the conversion which is also used to inhibit the stepping of stepped generator 8. In another arrangement (Fig. 3, not shown) the test signal is formed by imposing a squarewave high frequency signal upon a sawtooth signal thereby generating a stepped sawtooth signal. The removed test signal is filtered to recover signals centred about the high frequency signal which above a certain level are again indicative of inaccuracies in the conversion.