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Device for ortsaufloesenden material analysis of a sample
Device for ortsaufloesenden material analysis of a sample
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机译:用于样品的奥尔索夫森登材料分析的装置
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摘要
In apparatus for examining the material of a specimen with local resolution employing an X-ray probe and operating according to the scanning principle, including a source of X-ray radiation, an optical system for directing X-ray radiation from the source onto the specimen, and a detector disposed for detecting radiation appearing behind the specimen, the source is constituted by a target in which the X-ray radiation is generated, and the optical system acts to focus the X-ray radiation emanating from the target onto the specimen in the form of an X-ray probe.
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