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Fail=safe logic with AND=gate and memory - produces programmed signal whose delayed delay time is only shortened if component fails

机译:失败=具有AND =门和存储器的安全逻辑-产生编程的信号,仅当组件发生故障时,延迟的延迟时间才会缩短

摘要

The logic circuit produces a programmed signal with delayed decay time. It is designed so that if a component fails the delayed decay time is only shortened or disappears. A fail-safe AND-gate and a fail-safe memory are connected together such that the input of the AND-gate that receives the input signal is connected to one input of the memory. The output of the memory is fed back to that input of the AND-gate that receives the clock pulses. The AND-gate output is connected via a growth OR-gate to the growth input of the memory. Both the AND-gate and the memory have capacitors to maintain a time-limited control potential.
机译:逻辑电路产生具有延迟衰减时间的编程信号。其设计目的是,如果某个组件发生故障,则延迟的衰减时间只会缩短或消失。故障安全与门和故障安全存储器连接在一起,从而接收输入信号的与门的输入连接到存储器的一个输入。存储器的输出反馈到与门的输入,该输入接收时钟脉冲。 AND门输出通过增长OR门连接到存储器的增长输入。 “与”门和存储器均具有电容器,以维持限时控制电位。

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