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Common beam aperture for dual beam spectrophotometers

机译:双光束分光光度计的通用光束孔径

摘要

Apparatus compensating for "aperturing effects" produced when a sample holding aperture is incorporated in the sample beam of a conventional dual beam spectrophotometer to allow examination of very small size samples. Such effects usually take the form of undesired variations in the base line output of the spectrophotometer at wavelengths where the spectrophotometer slits open wider than the sample aperture in an attempt to produce a constant energy scan over a given spectrum. The apparatus comprises a second aperture optically equivalent to the sample aperture and located at a slit image point in a common beam portion of the spectrophotometer.
机译:当在传统的双光束分光光度计的样品光束中加入样品保持孔时,该仪器可补偿“打孔效应”,从而可以检查非常小的样品。这种影响通常表现为分光光度计的基线输出在某些波长处的不希望有的变化形式,其中分光光度计的缝隙打开得比样品孔径更宽,从而试图在给定光谱上进行恒定的能量扫描。该装置包括第二孔,该第二孔在光学上与样品孔等效,并且位于分光光度计的公共光束部分中的狭缝图像点处。

著录项

  • 公开/公告号US4172637A

    专利类型

  • 公开/公告日1979-10-30

    原文格式PDF

  • 申请/专利权人 BECKMAN INSTRUMENTS INC;

    申请/专利号US19770863769

  • 发明设计人 HOWARD J. SLOANE;

    申请日1977-12-23

  • 分类号G05D25/00;

  • 国家 US

  • 入库时间 2022-08-22 19:15:11

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