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Procedures and equipment for studying surface phenomena through field effect, by means of an emission point

机译:通过场效应通过场效应研究表面现象的程序和设备

摘要

A device for investigating surface phenomena by field emission contains an emission point in an evacuatable enclosure facing a fluorescent screen. The point is desorbed by a first pulse which produces sufficient heating of the point to attain substantially complete desorption and field emission or field desorption is produced by a second pulse spaced a controllable time after the desorption pulse. Repetitive measurements are possible by producing a train of the first and second pulses during which parameters can be varied and the results observed. Methods are disclosed for determining the temperature of the point from the measured field emission both by relating field emission to temperature and by relating temperature to desorption.
机译:用于通过场发射调查表面现象的设备在面向荧光屏的可抽空外壳中包含一个发射点。通过第一脉冲对该点进行解吸,该第一脉冲对该点进行足够的加热以实现基本上完全的解吸,并且通过在该解吸脉冲之后以可控制的时间间隔开的第二脉冲来进行场发射或场解吸。通过产生一系列的第一和第二脉冲可以进行重复的测量,在此期间可以改变参数并观察结果。公开了用于通过将场发射与温度相关并且通过将温度与解吸相关来从所测量的场发射中确定点的温度的方法。

著录项

  • 公开/公告号US4206408A

    专利类型

  • 公开/公告日1980-06-03

    原文格式PDF

  • 申请/专利权人 AGENCE NAT VALORISATION RECHERCHE;

    申请/专利号US19770818327

  • 发明设计人 MICHAEL DRECHSLER;

    申请日1977-07-22

  • 分类号G01N25/00;

  • 国家 US

  • 入库时间 2022-08-22 17:04:16

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