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Direct reading micrometer for sine-bar elevation

机译:直读千分尺,用于正弦波标高

摘要

The combination of a sine-bar and micrometer for directly reading angular displacement of the sine-bar, the micrometer being comprised of a barrel having a curvilinear index line with axial calibration in degrees and displaced from rotation of an extension screw of uniform pitch, and a thimble with circumferential calibrations in minutes and rotating with the said extension screw to be revolved in reference to said curvilinear index line and thereby extended in decreasing amounts corresponding to the height dimensions required in order to establish sine-bar angularity, and with curvilinear vernier calibrations parallel to said curvilinear index line for readings in seconds as well as degrees and minutes.
机译:正弦条和千分尺的组合,用于直接读取正弦条的角位移,该千分尺包括一个具有曲线索引线的镜筒,其轴向校准度为度数,并且偏离了均匀螺距的延伸螺钉的旋转,并且在几分钟内进行周向校准的顶针,并与所述延伸螺钉一起旋转,使其相对于所述曲线分度线旋转,从而以与确定正弦条角度所需的高度尺寸相对应的减小量延伸,并进行曲线游标校准平行于所述曲线索引线,以秒,度和分钟为单位的读数。

著录项

  • 公开/公告号US4238888A

    专利类型

  • 公开/公告日1980-12-16

    原文格式PDF

  • 申请/专利权人 GOLDSMITH WESLEY R;

    申请/专利号US19760740813

  • 发明设计人 WESLEY R. GOLDSMITH;

    申请日1976-11-11

  • 分类号G01B3/18;G01B3/30;

  • 国家 US

  • 入库时间 2022-08-22 14:51:16

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