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fotometer for anvendning in photometric tjockleksmetning of optically thin layers during the construction of vakuumbestrykningsanleggningar
fotometer for anvendning in photometric tjockleksmetning of optically thin layers during the construction of vakuumbestrykningsanleggningar
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机译:照相光度计,用于在光变层的构造过程中对光学薄层进行光度测量
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摘要
An arrangement and photometer for measuring and controlling the thickness of optically active thin layers wherein the axis of the measurement light beam coming from the measurement light source is directed to the measurement object and a referenced light receiver, independent of the optical properties of the measurement object, is associated with the measurement light beam. The output signal of the referenced light receiver is mixed with a trigger stage for a phase sensitive photometer amplifier and is fed to a compensation circuit for the equilization of brightness variations in the measurement light source.
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