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Metrological detection photo-electric system - uses optical assembly with three diffraction gratings with specified geometrical inter-relationships
Metrological detection photo-electric system - uses optical assembly with three diffraction gratings with specified geometrical inter-relationships
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机译:计量检测光电系统-使用带有三个具有特定几何相互关系的衍射光栅的光学组件
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摘要
The optical location system is based upon six main components; a lamp source (1), a convergent lens (2), three linear diffraction gratings (3, 4, 5) in a mutually parallel arrangement, and a photocell (6). The spacings of the diffraction gratings (3, 4, 5) are respectively equivalent to three light frequencies (f1, f2, f3). The geometrical arrangements are such that distances (U, V) between the first/second and second/third gratings are related by f2/f1 = V(U + V). Similar expressions relate the effective apertures. Alternative geometrical arrangements include angled mirror reflectors. The photocell forms part of an electronic circuit and may also have a periodic structure, including semi-conductors, for the detection of Moire fringes.
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机译:光学定位系统基于六个主要组件;光源(1),会聚透镜(2),相互平行布置的三个线性衍射光栅(3、4、5)和光电管(6)。衍射光栅(3、4、5)的间距分别等于三个光频率(f1,f2,f3)。几何布置使得第一/第二和第二/第三光栅之间的距离(U,V)与f2 / f1 = V(U + V)有关。类似的表达式涉及有效孔径。替代的几何布置包括成角度的镜面反射器。光电管构成电子电路的一部分,并且还可以具有周期性结构(包括半导体),用于检测莫尔条纹。
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