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Display device, by holographic interferometry, of the deformations of structures deformable

机译:通过全息干涉法显示可变形结构的变形的显示装置

摘要

P the invention relates to the display of the deformation of deformable structures by interferometry holographic. It relates to a display device in which the interferogram of the object, obtained by double exposure for a periodic deformation or by exposure to the long period of vibration for a vibrating object, is recorded in a crystal electro - optic and photoconductor to which is applied an electric field is substantially orthogonal to the mean direction of the fringes. The interferogram is observed in a plane image or recorded in a memory in the case where one wishes to keep the information for the reading is destructive, the information. / p & & p & the invention applies to the non-destructive testing of mechanical parts placed under stress. / p
机译:本发明涉及通过全息照相全息术对可变形结构的变形的显示。本发明涉及一种显示装置,在该显示装置中,通过对周期性变形进行两次曝光或对振动的物体进行长时间的振动曝光而获得的物体的干涉图被记录在所应用的晶体光电和光电导体中。电场基本上垂直于条纹的平均方向。在希望保留用于读取的信息是破坏性信息的情况下,在平面图像中观察干涉图或将其记录在存储器中。 & &本发明适用于置于应力下的机械零件的无损检测。

著录项

  • 公开/公告号FR2385079B1

    专利类型

  • 公开/公告日1981-12-11

    原文格式PDF

  • 申请/专利权人 THOMSON CSF;

    申请/专利号FR19770008627

  • 发明设计人

    申请日1977-03-23

  • 分类号G01B9/027;G01B11/16;G03H1/00;

  • 国家 FR

  • 入库时间 2022-08-22 12:31:49

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