Polishing appts. for small mineral samples e.g. dust particles - has rotatably mounted sample carrier, perpendicular to and below polishing surface, which can be bought under telescope

摘要

The device contains a sample-holder placed on a support mounted on a carriage moving along fixed guiding rails. The position of the support can be adjusted vertically and horizontally. The carriage moves between two positions. In one position, the sample-holder is placed exactly under a polishing plate rotating round a vertical axis. In the other position, the sample-holder is placed exactly under the lens of a microscope which is mounted on a fixed support. With this device, the polishing can be easily and better controlled as the sample is instantly located after each polishing phase. Furthermore the polishing cannot go beyond a predetermined level. To each adjustment element is associated a measuring scale.