首页> 外国专利> Process for testing A/D and/or D/A converters or electric transmission networks comprising such converters or connected in series with said networks, particularly for testing codecs for PCM apparatuses, and device for the application of said process

Process for testing A/D and/or D/A converters or electric transmission networks comprising such converters or connected in series with said networks, particularly for testing codecs for PCM apparatuses, and device for the application of said process

机译:用于测试A / D和/或D / A转换器或包括这种转换器或与所述网络串联连接的电传输网络的方法,特别是用于测试PCM设备的编解码器的方法以及用于所述方法的设备

摘要

Method for testing analog-to-digital converters and / or digital-to-analog converters or communications transmission sections which contain such converters or are connected in series with them, for digital communication devices, in particular for testing codecs for PCM devices, and Device for performing the method. The device under test is loaded with an analog, preferably sinusoidal, periodic measurement signal or with digital samples of such a measurement signal, with a numerical ratio between the period of the measurement signal and the system-specific sampling period such that all sampling times within a predetermined test period have different relative time positions in the periodicity interval of Have measurement signal. This creates a large amount of output information from the test object, which in its entirety describes the test object's response to the measurement signal as precisely as desired. This output information is optionally stored in a memory after analog-digital conversion in a standard encoder and is available for determining the properties sought for the test object, e.g. of the level-dependent distortions, using a computer.
机译:用于数字通信设备,尤其是用于测试PCM设备的编解码器的模数转换器和/或数模转换器或包含此类转换器或与其串联连接的通信传输部分的测试方法以及装置用于执行该方法。在被测设备上加载模拟的(最好是正弦的)周期性测量信号或这种测量信号的数字样本,并在测量信号的周期与系统特定的采样周期之间建立数值比,以使所有采样时间在预定的测试周期在具有测量信号的周期性间隔中具有不同的相对时间位置。这会从测试对象创建大量输出信息,这些输出信息整体上将准确描述所需对象对测量信号的响应。在标准编码器中进行模数转换后,该输出信息可选地存储在存储器中,并且可用于确定测试对象所寻求的特性,例如测试对象的特性。使用计算机来确定与电平有关的失真。

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