In an ion beam separator for use in ion implantation, the ion beam is scanned in both X and Y directions over a target. `Y` scan is achieved by electrostatic beam deflection located close to the region where the ion beam exits from the influence of the deflecting magnet. `X` scan is preferably provided by rectilinear target movement. Beam width or intensity control is achieved using a rotatable slit. Targets are transferred sequentially across the beam from a pack on one side and are re-stacked on the other side of the beam after exposure.
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