SIMULTANEOUS COLLECTOR FOR DIFFRACTION DATA AND SPECTRAL PHOTOGRAPH DATA

摘要

An arrangement is provided for the simultaneous collection of both diffraction and spectrographic data in which diffracted radiation 4 from a source 2 is directed, via specimen 1, onto a proportional detector 6, and characteristic fluorescent emission 5 from the specimen is also directed to the proportional detector. Selection is made by means of a computer controlled pulse height selector 7 of either the diffracted photons from the source or the fluoresced photons from the specimen during quantitative data collection scan, and the diffracted photon and fluorescent photon measurements are stored in different data files 8, 9 for evaluation of the specimen.